Showing results: 1891 - 1905 of 2458 items found.
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HLC series -
Jinan Testing Equipment IE Corporation
HLC series single space Servo-Hydraulic UTM of Compact Type is designed for low capacity test. The single space compact type hydraulic universal testing system has rigid and compact design for testing the tensile, compression, bending, shearing and hardness of metal and non-metallic materials. Configured with extensive range of accessories for various applications, the hydraulic universal testing machine can provide the optimal testing solutions for your individual application needs. The single space Servo-Hydraulic UTM of Compact Type is easy to operate and is versatile in the applications of metallurgy manufacturers such as steel mills & alloy, reinforced bar, aircraft industry, research institutes, laboratories, calibration institutes etc.
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THW-L1 -
Thermtest Instruments
The Transient Hot Wire (THW-L1) Liquid Thermal Conductivity Meter is an advanced measurement system for direct determination of the thermal conductivity, thermal diffusivity, and specific heat instrument for measurement of liquids and pastes in accordance with ASTM D7896-19. The THW-L1 was designed with speed and operational simplicity in mind. With a single measurement of 1 second in duration, small volumes of liquids and pastes can be accurately and precisely measured for thermal conductivity, thermal diffusivity, and specific heat. The THW-L1 utilizes a non-stationary measurement approach and rapid test times to limit convective effects for samples with a wide range of viscosities. The THW sensor consists of a thin heating wire 40 mm in length and is completely inserted into the sample to be tested.
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PDF Solutions
PDF Solutions Professional Services offerings cover every major project phase. Available for a specific phase of your project needing a custom solution, or an end-to-end implementation, PDF Solutions Professional Services produces results fast.Realize quicker ROI from your semiconductor test data investmentOffering a broad range of planning, education, design engineering, implementation and support, our team of highly trained semiconductor data integration engineers and analytics consultants can help you build your solution with confidence. These experts can assist your team with:Business Practices AssessmentsBest Practices ImplementationYield AnalysisProduct Characterization SetupSystem DeploymentSite PlanningFlow AnalysisCustom Parser Development
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11050 -
Chroma Systems Solutions, Inc.
The Chroma 11050 Series HF LCR Meter is a precision test instrument designed to accurately measure and evaluate passive components at high speeds. Its measurement capabilities cover the primary and secondary parameters required for testing the inductance, capacitance, resistance, quality factor and loss factor of passive components. The HF LCR Meter has a broad testing frequency range 75kHz~30MHz/1kHz~10 MHz/60Hz~5MHz suitable for analyzing component characteristics under different frequencies. Its 0.1% basic measurement accuracy provides stable and highly reliable results. A fast 7ms measurement speed effectively increases productivity when working in an automated environment.
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Spider-80SG -
Crystal instruments
The Spider-80SG is a high precision, general purpose data acquisition device featuring strain gage measurement. This device can be used in a variety of physical and measurement tests. The Spider-80SG can acquire data from a strain gage or a wide range of measurement quantities. A variety of general purpose and strain gage based sensors are supported. The Spider-80SG is built on the proven outstanding performance and reliability of Crystal Instruments’ DSP-based hardware platform. It features the same form factor as other Spider-80X front-ends from Crystal Instruments and can be configured into one measurement system with excellent compatibility and scalability. This gives the Spider-80SG capabilities to reliably acquire data from multiple sensors and for multiple measurement quantities simultaneously.
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85131H -
Keysight Technologies
The Keysight 85131H is a 62.2 cm (24.5 in) long1 flexible cable with a 3.5 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss greater than or equal to 16 dB. Insertion loss is 0.25 * sqrt (f) + 0.2 dB (where f is frequency is GHz) for the test port connector, and 1.5 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 3 inch radius. Stability1 of the Keysight 85131H is less than 0.12 dB and phase is 0.13o * f + 0.5o, (where f is frequency in GHz).
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85134H -
Keysight Technologies
The Keysight 85134H is a 62.9 cm (24.75 in) long1 flexible cable with a 2.4 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss greater than or equal to 16 dB. Insertion loss is 0.31 * sqrt (f) + 0.2 (where f is frequency is GHz) for the test port connector and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 2.5 inch radius. Stability1 of the Keysight 85134H is less than 0.12 dB and phase is less than 0.13o * f + 0.5o, (where f is frequency in GHz).
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CRY5520 -
CRYSOUND
CRY5520 Audio signal generator uses SCM for sweep control and the digital-analog mode and performs stably. With very low distortion, sine wave output, good stability, and frequency range for the entire audio frequency domain, it is especially suitable for the pure tone test of speakers and headphones. It can work in both logarithmic sweep and manual frequency modulation modes. The sweep start point, end point and sweep time can be set randomly. Manual frequency modulation is divided into rough modulation and fine modulation, which can quickly and accurately modulate frequency. It adopts 128 × 64 dot matrix LCD and simultaneously displays frequency and voltage values with synchronous output.
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Environment Associates Inc.
Environment Associates provides everything you need in drop shock testing — package/container, drop shock/impact systems and electro-dynamic simulated pulses. With our equipment, we specialize in tuned, matched impacts from 20 Gs to 30,000 Gs and from 30 ms to .02 ms in sine, saw-tooth, square-wave, gunfire and rotational cam pulses for almost any set of standards, or for any real-life condition. We can also handle a large range of weights and sizes. EA’s specialists will match the right test, equipment and configurations to your product. We also provide fixture design and special set-up solutions to mount and monitor your product’s functionality during and after testing.
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T5833/T5833ES -
Advantest Corp.
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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781622-01 -
NI
PXIe, 9-Slot, Up to 1.75 GB/s PXI Chassis—The PXIe‑1078 features a backplane that incorporates a PCI Express connection to every slot to meet a wide range of test and measurement application needs. It accepts PXI Express modules in every slot and supports standard PXI hybrid-compatible modules in up to five slots.
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Pickering Interfaces Ltd.
Our range of flexible PXI Analog Output modules features high accuracy & high resolution voltage and current sources that satisfy a wide variety of applications in Automated Test, including sensor and transducer simulation. Each product has a number of variants with differing channel counts to closely match a user’s specific requirements.
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iPA Series -
Kaelus
The iPA Series Passive Intermodulation (PIM) analyzer is the first battery powered PIM Test Analyzer versatile enough to support multiple test scenarios such as testing at the top of the tower, base of tower, roof top and in-building for DAS systems. This IEC compliant 20W, rugged, battery operated design includes a tablet computer in a ruggedized case for remote control. This allows hands-free dynamic testing that is safe and convenient. Add the optional Range to Fault (RTF) module to quickly identify the location of PIM and Return Loss sources.
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Extech PRT200 -
Extech Instruments Corporation
The PRT200 is a non-contact phase sequence tester that tests up to 1000 VAC with visual/audible indication. The tester has a 45 to 65Hz frequency range, features adjustable Hi/Lo LED brightness switch for making measurements in dimly lit areas or sunlight, low battery warning and fully insulated alligator clips with wide jaws. The product has a CAT IV 600 Volt safety rating and is complete with a year warranty, three built-in 30 in. test leads with large color-coded alligator clips, 4 AA batteries, and a pouch case.
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Extech GRT300 -
Extech Instruments Corporation
The GRT300 measures earth ground in 4 ranges from 2 to 2000 Ohm. 4-wire, 3-wire, and 2-wire testing. Large dual line LCD. Automatic I (current) and P (potential) spike check. Test Hold function for easy operation. Autoranging, Automatic Zero adjustment, Data Hold and Auto Power off. AC Earth Voltage. Overrange and low battery indication. Complete with test leads with alligator clips, 4 auxiliary earth bars, hard carrying case, and eight 1.5V AA batteries.
